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Fig. 3 | Micro and Nano Systems Letters

Fig. 3

From: Silicon nanoparticles: fabrication, characterization, application and perspectives

Fig. 3

a (left) XPS spectras, (center) Bright-field TEM images, (right) XRD patterns. Reprinted from [32] with permission from American Chemical Society. b HRTEM image of a region of milled silicon nanoparticle. Reprinted from [33] with permission from Springer Nature. c Calculated Raman spectra of silicon nanocrystals with various sizes. Reprinted from [34] with permission from AIP Publishing. d (top) Experimental scattering color visible range of selected silicon nanoparticles and (bottom) their corresponding SEM images for different values of diameters from 84 to 220 nm. Reprinted from [4] with permission from American Chemical Society. e UV–Vis spectra of the silicon nanoparticles. Reprinted from [35] with permission from Springer Nature. f FT-IR spectrum of silicon nanoparticle powder measured in diffuse reflection. Reprinted from [36] (CC BY 4.0). g Photoluminescence spectra of silicon nanocrystals of 2.5, 3.8 and 6.2 nm diameter. Reprinted from [37] (CC BY 4.0). H SANS data for a-Si and nano-Si before ball milling with corresponding fits (continuous lines) based on size distributions obtained via a Monte Carlo analysis. Reprinted from [38] (CC BY 4.0)

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