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Table 5 Thermal sensitivity validations

From: Multiple ratiometric nanothermometry using semiconductor BiFeO3 nanowires and quantitative validation of thermal sensitivity

 

\(S_{r}\) max (% K−1) @ 300 K (Table 1)

AHP model (Table 2b)

LR values

Ideal values

Normalized

Normalized

E2/E1

0.43

0.254

0.2211

E2/E3

0.51

0.301

0.3189

E2/E4

0.75

0.443

0.4599