Figure 10From: A review of silicon microfabricated ion traps for quantum information processing Y-junction surface ion trap of national institute of standards and technology (NIST) group [ 67 ]. (a) An optimized design of RF electrodes at the center of junction. (b) Charge coupled device (CCD) images of selective ion transports through a Y-junction geometry. White arrows point the location of the transported ion.Back to article page